2007 IEEE International Electron Devices Meeting 2007
DOI: 10.1109/iedm.2007.4418924
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45nm High-k/Metal-Gate CMOS Technology for GPU/NPU Applications with Highest PFET Performance

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Cited by 9 publications
(4 citation statements)
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“…As illustrated in Figure 1, these innovations include channel mobility enhancement by process-induced strain [4][5][6][7][8][9][10], Tinv scaling with gate tunneling reduction by high-K/metal gate [11][12][13], and electrostatic control improvement by transition from planar single gate to 3D FinFET/Multi-Gate FET (MUGFET) structures [14][15][16][17][18][19][20]. These transistor performance enhancements have also increased process complexity significantly.…”
Section: Device Scaling Trend and New Tcad Challengesmentioning
confidence: 99%
“…As illustrated in Figure 1, these innovations include channel mobility enhancement by process-induced strain [4][5][6][7][8][9][10], Tinv scaling with gate tunneling reduction by high-K/metal gate [11][12][13], and electrostatic control improvement by transition from planar single gate to 3D FinFET/Multi-Gate FET (MUGFET) structures [14][15][16][17][18][19][20]. These transistor performance enhancements have also increased process complexity significantly.…”
Section: Device Scaling Trend and New Tcad Challengesmentioning
confidence: 99%
“…In addition, there are also NPU, DPU, etc. [79][80][81]. FPGA is a processor for developers to customize; usually, an image processor integrates machine vision perception and recognition algorithms.…”
Section: Differences and Similarities Between Human Vision And Bionic...mentioning
confidence: 99%
“…For example, Google has developed an ASIC-based TPU that is dedicated to accelerating the computing power of deep neural networks[78]. In addition, there are also NPU, DPU, etc [79][80][81]…”
mentioning
confidence: 99%
“…Hf-based high-k gate dielectric was used in this work. A key challenge in integrating high-k dielectrics and metal gate into a conventional CMOS flow is to avoid film stack degradation from thermal cycles and at the same time preserve the benefits of the channel mobility enhancing techniques [4].…”
Section: Device Architecture and Process Integrationmentioning
confidence: 99%