3d X-Ray Diffraction Microscopy

Abstract

Three-dimensional X-ray diffraction (3DXRD) microscopy is a fast and nondestructive structural characterization technique aimed at the study of individual crystalline elements (grains or subgrains) within mm-sized polycrystalline specimens. It is based on two principles: the use of highly penetrating hard X-rays from a synchrotron source and the application of "tomographic" reconstruction algorithms for the analysis of the diffraction data. In favorable cases, the position, morphology, phase, and crystallographic orientation can be derived for up to a thousand elements simultaneously. For each grain its average strain tensor may also be derived, from which the type-II stresses can be inferred. Furthermore, the dynamics of the individual elements can be monitored during typical processes 205 Strain and Dislocation Gradients from Diffraction Downloaded from www.worldscientific.com by PURDUE UNIVERSITY on 04/13/15. For personal use only.

13. On the reconstruction of static and dynamic discrete structures

“…More stochastic approaches to grain map reconstruction can be found in [155,157,158,165]. For alternative approaches, see [49,151,152,153,164,167,168].…”

3D characterization of partially recrystallized Al using high resolution diffraction contrast tomography

“…During the last 15-20 years, several non-destructive 3D characterization techniques have been invented and implemented using synchrotron X-rays, including 3D X-ray diffraction (3DXRD) [5][6][7][8], diffraction contrast tomography (DCT) [9,10], Bragg coherent diffraction imaging [11,12] and 3D X-ray Laue microdiffraction [13,14]. Among these techniques, DCT allows fast 3D reconstruction of grains in fully recrystallized samples [15,16].…”