2016
DOI: 10.1021/acs.chemmater.6b00924
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3D Transition Metal Ordering and Rietveld Stacking Fault Quantification in the New Oxychalcogenides La2O2Cu2–4xCd2xSe2

Abstract: . (2016) '3D transition metal ordering and Rietveld stacking fault quantication in the new oxychalcogenides La2O2Cu24xCd2xSe2.', Chemistry of materials., 28 (9). pp. 3184-3195. Further information on publisher's website:http://dx.doi.org/10.1021/acs.chemmater.6b00924 Publisher's copyright statement: This document is the Accepted Manuscript version of a Published Work that appeared in nal form in Chemistry of Materials, copyright c American Chemical Society after peer review and technical editing by the p… Show more

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Cited by 24 publications
(31 citation statements)
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“…Stacking sequences are generated from a stacking probability matrix of the type used in the DIFFaX package [Treacy et al (1991); see for example Fig. 9 of Ainsworth et al (2016)]. In an initial step the probability matrix is used to generate N avg N str N v layers, and from this prediction run the number of Coelho, Evans and Lewis Stacking-fault analysis using Rietveld refinement 1741 electronic reprint each layer i to j transition is determined and placed in a summation matrix S, which is then divided by N avg to give S pred .…”
Section: Generating Stacking Sequencesmentioning
confidence: 99%
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“…Stacking sequences are generated from a stacking probability matrix of the type used in the DIFFaX package [Treacy et al (1991); see for example Fig. 9 of Ainsworth et al (2016)]. In an initial step the probability matrix is used to generate N avg N str N v layers, and from this prediction run the number of Coelho, Evans and Lewis Stacking-fault analysis using Rietveld refinement 1741 electronic reprint each layer i to j transition is determined and placed in a summation matrix S, which is then divided by N avg to give S pred .…”
Section: Generating Stacking Sequencesmentioning
confidence: 99%
“…Using I avg,hkl reduces ripples caused by poor faulting statistics, but does not eliminate the ripples caused by small N v . Ainsworth et al (2016) therefore used a large supercell, N v = 5000, to minimize both effects and generate a smooth pattern. Being able to reduce N v whilst (i) reducing ripples and (ii) describing smearing due to the use of a single c lattice parameter without degrading the faulted pattern would be hugely beneficial; the number of reflections would be greatly reduced, resulting in much less computer memory allocation and far greater computational speed.…”
Section: Smoothing Ripples and Correcting For Differing Layer Thicknementioning
confidence: 99%
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