3D-terahertz-tomography for material inspection and security

Quast, Holger; Löffler, Thomas

doi:10.1109/icimw.2009.5325639

Cited by 33 publications

(14 citation statements)

References 1 publication

Supporting

Mentioning

Contrasting

Order By: Relevance

“…Both pulsed and CW THz waves can be applied to tomographic imaging of layer structure of tablets, internal structures of objects, material inspection, security applications, etc. [42,43,44,45,46,47,48] In addition to the above limited examples, a wide range of nondestructive inspection and testing applications have been reported in order to find real and specific needs which cannot be duplicated by competing technologies.…”

Section: Imagingmentioning

confidence: 99%

Terahertz technologies: present and future

Nagatsuma

2011

IEICE Electron. Express

184

View full text Add to dashboard Cite

A number of technical breakthroughs in electronics and photonics made since the early 1990s have started to bring terahertz (THz)-wave technologies from laboratory demonstrators to industrial applications such as non-destructive testing, security, medicine, communications, etc. This paper overviews the latest progress in THz-wave technologies in terms of components such as sources and detectors, and system applications, and discusses future challenges towards market developments. Keywords: terahertz, source, detector, spectroscopy, imaging, communication Classification: Fiber optics, Microwave photonics, Optical interconnection, Photonic signal processing, Photonic integration and systems References[1] D. Grischkowsky, S. Keiding, M. van Exter, and Ch. Fattinger, "Farinfrared time-domain spectroscopy with terahertz beams of dielectrics and semiconductors,"

show abstract

Section: Imagingmentioning

confidence: 99%

Terahertz technologies: present and future

Nagatsuma

2011

IEICE Electron. Express

184

View full text Add to dashboard Cite

show abstract

“…Previous CW THz approaches for layer thickness determination include Manuscript full electronic [7] as well as optoelectronic configurations [8]. Electronic systems are limited by their low frequency tuning range, making it impossible to measure thin m layers, and the acquisition speed of optoelectronic approaches is too slow for industrial applications.…”

Section: Introductionmentioning

confidence: 99%

Multilayer Thickness Determination Using Continuous Wave THz Spectroscopy

Stanze

Globisch

Dietz

et al. 2014

IEEE Trans. THz Sci. Technol.

View full text Add to dashboard Cite

We present a multilayer thickness measurement system based on optoelectronic continuous wave THz spectroscopy. Due to its wide tuning range, high frequency resolution, and fast data acquisition the system combines micrometer precision with short measurement time. In addition, the presented system is not limited by the uncertainty of previous continuous wave signals and is therefore capable of measuring thick layers. Thus, the presented system and measurement method are a cost effective alternative to THz time-domain systems in the field of thickness measurements.

show abstract

“…In particular, several methods of THz three-dimensional (3D) imaging, or THz tomography have been proposed and developed [1][2][3][4]. Most of them including commercial ones employ THz pulse waves generated by femtosecond pulse lasers.…”

Section: Introductionmentioning

confidence: 99%

Terahertz imaging based on optical coherence tomography

Nagatsuma¹,

Ikeo²,

Nishii³

2013

ICECom 2013

View full text Add to dashboard Cite

Three dimensional (3D) terahertz ( THz) imaging or THz tomography has recently proven to be useful for non-destructive testing of industrial materials and structures. In place of previous imaging techniques such as THz pulse radar, we propose a THz optical coherence tomography ( OCT) using two kinds ofTHz sources such as incoherent noise and frequency-swept sources, and demonstrate 3D imaging in the frequency regions from 300 GHz to 800 GHz.

show abstract

3D-terahertz-tomography for material inspection and security

Cited by 33 publications

References 1 publication

Terahertz technologies: present and future

Terahertz technologies: present and future

Multilayer Thickness Determination Using Continuous Wave THz Spectroscopy

Terahertz imaging based on optical coherence tomography

Contact Info

Product

Resources

About