3D effects in VLSI/ULSI MOSFETs: a novel analytical approach to model threshold voltage

Lahiri, S. K.; Das, Mrinal K.; Gupta, Ankita; Manna, I.

doi:10.1109/icvd.1994.282713

Proceedings of 7th International Conference on VLSI Design

DOI: 10.1109/icvd.1994.282713

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3D effects in VLSI/ULSI MOSFETs: a novel analytical approach to model threshold voltage

S. K. Lahiri

Mrinal K. Das

Ankita Gupta³

et al.

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3D effects in VLSI/ULSI MOSFETs: a novel analytical approach to model threshold voltage

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References 11 publications

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