35.3: Exo‐electron Measurements in AC‐PDPs with Exposed Address‐Electrode Structure

Abstract

An uncoated address-electrode structure is adopted for the measurement of exo-electron emission in AC-PDPs. In this way the surface charging effects of the rear dielectric layer and phosphor layers are eliminated. By applying waveforms with different number of sustaining pulses, the exo-electron emission is measured during a full TV frame.

37.1: Invited Paper: Surface Electronic States of MgO Induced by Auger Neutralization Process

“…Surface states were found to be excited by Auger neutralization process. This is quite similar results with VUV excited TL [9] and exo-electron measurements [12]. Figure 6 shows a schematic of MgO midgap states both for surface and bulk.…”

“…Surface states were found to be excited by Auger neutralization process. The excitation process was same as observed for exo-electrons [12].…”

35.2: Invited Paper: A Consideration of Excitation and De‐excitation Process of MgO Protective Layer

“…At least, it is clear that that the number of trapped electrons is depending on the VUV excitation time, and also a certain de-trapping mechanisms are working on trapped electrons. Figure 8 shows the effect of applied sustain bias voltage on the exo-electron currents [9]. The number of sustain pulse bias were varied to see how the electrons are excited to the exoelectron traps by discharge.…”