35.2: Invited Paper: A Consideration of Excitation and De‐excitation Process of MgO Protective Layer

Abstract

Dynamic response of MgO protective layer to VUV irradiation and discharge is investigated by using cathode luminescence (CL) spectroscopy, thermolimunescence (TL) spectroscopy and exoelectron analysis. The dynamics of excitation and de-excitation processes of electron and hole traps are discussed.

37.1: Invited Paper: Surface Electronic States of MgO Induced by Auger Neutralization Process

“…Surface states were found to be excited by Auger neutralization process. This is quite similar results with VUV excited TL [9] and exo-electron measurements [12]. Figure 6 shows a schematic of MgO midgap states both for surface and bulk.…”

“…It is obvious that only a slight increase of γ from MgO realized low firing voltage, suggesting that higher γ protective layer such as SrO is not so much necessary for voltage reduction. shows the VUV excited TL spectrum accumulated between 50 and 300 K [9]. This is totally different from Fig.…”

“…In the case of VUV excitation, TL peaks ranged between 3 and 60 meV [9]. The TL measurements done above 300 K reported the activation energy of electron traps as 310 meV [7].…”

“…Figure 6 shows a schematic of MgO midgap states both for surface and bulk. In the figure, the 700 nm emission observed in TL spectrum is plotted assuming that this is due to hole traps [9].…”

“…b) Thermoluminescence spectrum of MgO accumulated between 50 and 300 K. The sample was excited by VUV radiation (147 nm)[9].…”