2018
DOI: 10.1364/oe.26.021887
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Microscope calibration using laser written fluorescence

Abstract: There is currently no widely adopted standard for the optical characterization of fluorescence microscopes. We used laser written fluorescence to generate two- and three-dimensional patterns to deliver a quick and quantitative measure of imaging performance. We report on the use of two laser written patterns to measure the lateral resolution, illumination uniformity, lens distortion and color plane alignment using confocal and structured illumination fluorescence microscopes.

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Cited by 37 publications
(27 citation statements)
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“…The pixel size and axial image separation were determined using a specially designed femtosecond laser-etched sample slide as shown in Fig. 4 [12,11]. The calibration specimen was composed of a 1 mm thick sheet of acrylic into which was embedded a well defined array of features using a direct laser writing process detailed in [13].…”
Section: Methodsmentioning
confidence: 99%
“…The pixel size and axial image separation were determined using a specially designed femtosecond laser-etched sample slide as shown in Fig. 4 [12,11]. The calibration specimen was composed of a 1 mm thick sheet of acrylic into which was embedded a well defined array of features using a direct laser writing process detailed in [13].…”
Section: Methodsmentioning
confidence: 99%
“…Meanwhile, when using a patterned structure for remote phosphor configuration together with a non-phosphor-coated region in the perimeter area, a higher homogeneity of angular CCT and better color consistency could be achieved [18]. In addition, that the patterned sapphire substrate used in the remote phosphor is an advantage factor to get the color uniformity in the far field better than that in the conventional field [19][20][21]. Though, these aforementioned studies concentrate on the improvement of chromatic homogeneity and the lumen output of WLEDs with remote phosphor structure, they just demonstrated the results researched only on WLED packages with single LED chip and low color temperatures.…”
Section: Introductionmentioning
confidence: 99%
“…Finally, in the works of Corbett et al and Korpelainen et al [43,44], a laser interferometer is used for measuring the vertical displacement of the equipment head and comparing it with the equipment measurements.…”
Section: Introductionmentioning
confidence: 99%