2018
DOI: 10.1088/1361-6528/aad75e
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Wafer-scale very large memory windows in graphene monolayer/HfZrO ferroelectric capacitors

Abstract: We have fabricated and electrically characterized at the wafer scale tens of metal-ferroelectric (HfZrO)-semiconductor capacitors and metal-graphene monolayer-ferroelectric (HfZrO)-semiconductor capacitors with the same top electrode dimensions. We have found that the memory windows of the capacitors containing graphene are 3-4 times larger than the ferroelectric capacitors without graphene, and increase even more after annealing. This physical effect can be attributed to the additional electric field exerted … Show more

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Cited by 17 publications
(17 citation statements)
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“…Very recently, we have designed and fabricated HfZrO memories based on the graphene monolayer/ferroelectric (HfZrO)/semiconductor/metal configuration depicted in Figure . The memory windows of graphene‐based HfZrO memories are 3–4 times larger than those of ferroelectric memories without graphene; the ratio is increasing after annealing.…”
Section: D Ferroelectrics and Their Applicationsmentioning
confidence: 99%
See 1 more Smart Citation
“…Very recently, we have designed and fabricated HfZrO memories based on the graphene monolayer/ferroelectric (HfZrO)/semiconductor/metal configuration depicted in Figure . The memory windows of graphene‐based HfZrO memories are 3–4 times larger than those of ferroelectric memories without graphene; the ratio is increasing after annealing.…”
Section: D Ferroelectrics and Their Applicationsmentioning
confidence: 99%
“…The memory window for MFS and GMFS (left axis) and the enhancement factor R (right axis). Reproduced with permission . Copyright 2018, Institute of Physics, UK.…”
Section: D Ferroelectrics and Their Applicationsmentioning
confidence: 99%
“…Therefore, for the purpose of this work we performed a batch fabrication of HfZrO with a thickness of 6 nm on HRSi (Float-Zone Hyper Pure Silicon (FZ-HPS) P(100) by Topsil, resistivity ρ > 10, 000 •cm), with thickness of 525 µm using ALD growth methods and we used a series of characterization techniques to assign ferroelectricity to HfZrO. The details of fabrication and characterization (using PFM, XRD and XPS) are presented in [10] and in the Appendix. It is worth mentioning here two main aspects: (i) prior to the ALD process, the silicon wafer was subjected to surface treatment by exposure to UV-ozone for 15 min.…”
Section: Fabrication and Characterization Of Coplanar Lines On Hafnium Oxide Ferroelectric On Siliconmentioning
confidence: 99%
“…The interest in the development of HfO 2 -based ferroelectrics and devices based on them is also illustrated by the fact that several reviews about HfO 2 -based ferroelectrics have been recently published [7]- [9]. The applications of these amazing discoveries related to material science are fructified by the applications of new ferroelectrics based on doped HfO 2 in memories [9], [10], low-power transistors [11]- [13], and harvesting of electromagnetic (EM) energy based on HfZrO tunneling junctions [14]. Ferroelectrics were considered in the past the most promising materials for high-frequency tunable circuits, but this path was abandoned due to the high DC voltages required to tune the microwave circuits (i.e.…”
Section: Introductionmentioning
confidence: 99%
“…[2][3][4][5][6][7][8][9][10] The binary states, "0" and "1," are programmed by switching from one polarization state to the another by applying a bias that exceeds the coercive bias, V C , of the ferroelectric gate. [20][21][22][23] Graphene has been the workhorse of the 2D material family. Demonstration of wafer-level upscaling of graphene Fe-FETs, [13][14][15][16][17][18][19] on flexible foils, [23][24][25][26][27] and even fully solution-processed graphene Fe-FETs [19] has supported the proposed application of 2D materials for high-speed nonvolatile memories.…”
Section: Introductionmentioning
confidence: 99%