2010
DOI: 10.1017/s1431927610060460
|View full text |Cite
|
Sign up to set email alerts
|

2D Mapping of Bonding Changes at Peroskite Oxide Interfaces and Round Defects

Abstract: Extended abstract of a paper presented at Microscopy and Microanalysis 2010 in Portland, Oregon, USA, August 1 – August 5, 2010.

Help me understand this report

Search citation statements

Order By: Relevance

Paper Sections

Select...
1

Citation Types

0
1
0

Year Published

2012
2012
2024
2024

Publication Types

Select...
4

Relationship

0
4

Authors

Journals

citations
Cited by 4 publications
(1 citation statement)
references
References 0 publications
0
1
0
Order By: Relevance
“…Though XRF provides information analogous to that of energy dispersive X-ray spectroscopy (EDX), a widely available electron microscopy-based technique for compositional analysis, XRF offers several distinct advantages over EDX. Deceleration of electrons within a sample during EDX measurements generates white bremsstrahlung background radiation, limiting sensitivity to 0.1% [87] -a limitation not present in XRF, which uses photons as an excitation source, and accordingly has about 1000x the sensitivity of EDX. This boost in sensitivity not only reduces measurement time and energy dose imparted to a sample, but actually allows lower-energy emission of weaker L-or M-lines that would typically be masked by EDX background to be used for XRF analysis.…”
Section: Advantages Of Xrfmentioning
confidence: 99%
“…Though XRF provides information analogous to that of energy dispersive X-ray spectroscopy (EDX), a widely available electron microscopy-based technique for compositional analysis, XRF offers several distinct advantages over EDX. Deceleration of electrons within a sample during EDX measurements generates white bremsstrahlung background radiation, limiting sensitivity to 0.1% [87] -a limitation not present in XRF, which uses photons as an excitation source, and accordingly has about 1000x the sensitivity of EDX. This boost in sensitivity not only reduces measurement time and energy dose imparted to a sample, but actually allows lower-energy emission of weaker L-or M-lines that would typically be masked by EDX background to be used for XRF analysis.…”
Section: Advantages Of Xrfmentioning
confidence: 99%