2014
DOI: 10.1021/nl503747h
|View full text |Cite
|
Sign up to set email alerts
|

Carrier Thermalization Dynamics in Single Zincblende and Wurtzite InP Nanowires

Abstract: Using transient Rayleigh scattering (TRS) measurements, we obtain photoexcited carrier thermalization dynamics for both zincblende (ZB) and wurtzite (WZ) InP single nanowires (NW) with picosecond resolution. A phenomenological fitting model based on direct band-to-band transition theory is developed to extract the electron-hole-plasma density and temperature as a function of time from TRS measurements of single nanowires, which have complex valence band structures. We find that the thermalization dynamics of h… Show more

Help me understand this report
View preprint versions

Search citation statements

Order By: Relevance

Paper Sections

Select...
1
1

Citation Types

0
31
0

Year Published

2015
2015
2022
2022

Publication Types

Select...
4
2

Relationship

1
5

Authors

Journals

citations
Cited by 17 publications
(31 citation statements)
references
References 76 publications
0
31
0
Order By: Relevance
“…The dramatic increase in PL intensity for the GaAs 1− x Sb x /InP core–shell NWs over the GaAs 1− x Sb x bare core suggests a strong reduction in nonradiative recombination at the surface of the NWs. Transient Rayleigh scattering (TRS) spectroscopy has been shown to be a powerful technique to study the band structure, carrier thermalization dynamics, and carrier lifetime of single nanowires . The change of polarized Rayleigh scattering efficiency from the nanowire is defined as dR/R=Δ(R//R)/(R//R)where R// (R) represents the back‐reflected Rayleigh scattering of the nanowire with incident light polarized parallel (perpendicular) to the nanowire.…”
Section: Resultsmentioning
confidence: 99%
See 1 more Smart Citation
“…The dramatic increase in PL intensity for the GaAs 1− x Sb x /InP core–shell NWs over the GaAs 1− x Sb x bare core suggests a strong reduction in nonradiative recombination at the surface of the NWs. Transient Rayleigh scattering (TRS) spectroscopy has been shown to be a powerful technique to study the band structure, carrier thermalization dynamics, and carrier lifetime of single nanowires . The change of polarized Rayleigh scattering efficiency from the nanowire is defined as dR/R=Δ(R//R)/(R//R)where R// (R) represents the back‐reflected Rayleigh scattering of the nanowire with incident light polarized parallel (perpendicular) to the nanowire.…”
Section: Resultsmentioning
confidence: 99%
“…The NW was excited using a 632 nm continuous wave (CW) laser and the emission was detected with a linear InGaAs p‐i‐n photodetector array. For TRS experiments, NWs were dispersed onto a marked Si substrate and placed onto the copper cold finger of a constant helium flow cryostat. The NW was photoexcited by a pump pulse (550 nm) extracted from a Fianium supercontinuum source.…”
Section: Methodsmentioning
confidence: 99%
“…However, the carrier 1 2 3 4 5 6 7 8 9 10 11 12 13 14 15 16 17 18 19 20 21 22 23 24 25 26 27 28 29 30 31 32 33 34 35 36 37 38 39 40 41 42 43 44 45 46 47 48 49 50 51 52 53 54 55 56 57 58 59 60 temperature can be expected to be even higher in CdS and ZnO, since the optical excitation energy relative to the bandgap energy is larger here [40]. Thus, the ELR in CdS and ZnO is even more increased.…”
mentioning
confidence: 94%
“…These issues can be overcome by performing ultrafast optical pump-probe measurements on single NWs, [20][21][22][23][24][25][26][27][28] which has provided much insight into their intrinsic properties. For example, ultrafast optical microscopy (UOM) experiments, which are essentially optical pump-probe experiments with microscopic spatial resolution, have been performed on single Si NWs, revealing the dependence of carrier dynamics on light polarization and excitation fluence 25 as well as the NW diameter.…”
mentioning
confidence: 99%
“…22,25 This may indicate that the relaxation of carriers trapped in defect states is not very sensitive to the NW diameter, particularly at the larger diameters examined here, unlike the carriers in above-band gap extended states probed in other studies. [20][21][22][23][24][25][26] We then performed pump fluence-dependent measurements on the single GaN NW to explore the influence of the photoexcited carrier density on carrier dynamics ( Figure 3(a)). The data clearly show that carrier relaxation gets faster with increasing fluence (Fig.…”
mentioning
confidence: 99%