2012
DOI: 10.1002/j.2168-0159.2012.tb05744.x
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15.4: Backplane Process Technology for AMOLEDs with Bottom‐Gate TFTs and Laser Annealing

Abstract: TFT backplane process for AM‐OLED was developed by integrating a G8 compatible CW green laser annealing into conventional bottom‐gate TFT process. Novel coating channel‐etching‐stopper (CES) and contact doping processes achieved the same high TFT performance as LTPS without critically increasing extra process steps.

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Cited by 5 publications
(5 citation statements)
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“…The details of the developed crystallization technology by cw green laser annealing are described elsewhere. 8,10,11) After hydrogen plasma treatment, the microcrystalline silicon layer (c-Si) and amorphous silicon layer (a-Si) were successively formed on the polysilicon layer by PECVD. The thickness of the microcrystalline silicon layer was varied from 10 to 100 nm, while that of the amorphous silicon layer was varied from 10 to 30 nm.…”
Section: Methodsmentioning
confidence: 99%
See 1 more Smart Citation
“…The details of the developed crystallization technology by cw green laser annealing are described elsewhere. 8,10,11) After hydrogen plasma treatment, the microcrystalline silicon layer (c-Si) and amorphous silicon layer (a-Si) were successively formed on the polysilicon layer by PECVD. The thickness of the microcrystalline silicon layer was varied from 10 to 100 nm, while that of the amorphous silicon layer was varied from 10 to 30 nm.…”
Section: Methodsmentioning
confidence: 99%
“…The target of our project is to develop bottom-gate LTPS TFT backplanes for OLED displays, which can be more easily expanded for application to large substrates. [8][9][10][11] To achieve this target, novel TFTs having a double-crystalline silicon channel structure consisting of a polysilicon layer and a microcrystalline silicon layer as the active region were developed. To realize the fabrication on large substrates, we used the cw green laser annealing process to form the polysilicon layer.…”
Section: Introductionmentioning
confidence: 99%
“…Hence, it is too difficult for the factory of large substrate such as Gen10 to adopt the high‐mobility TFT process. Several studies reported about bottom gate LTPS TFT without LDD, which showed that α‐Si layer covering with poly‐Si was used in place of LDD. And the poly‐Si did not directly contacted with source and drain metal.…”
Section: Introductionmentioning
confidence: 99%
“…Hence it is too difficult for the factory of large substrate such as Gen10 to adopt the high mobility TFT process. Several studies reported about bottom gate LTPS TFT without LDD [4][5][6] , which showed D-Si layer covering with poly-Si was used in place of LDD. And the poly-Si didn't directly contacted with source and drain metal.…”
Section: Introductionmentioning
confidence: 99%