2010
DOI: 10.1117/12.853377
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1280 x 960 pixel microscanned infrared imaging module

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Cited by 7 publications
(2 citation statements)
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“…They measure the power of electromagnetic radiation indirectly via the temperature-dependent electrical resistance of the detector material, typically amorphous silicon, vanadium oxide, or silicon nitride. Microbolometers designed for infrared applications represent an established technology field, with typical resolutions of 640 × 480 pixels, even though arrays of up to 1280 × 960 pixels can be found [80]. For many practical applications, the scene imaged by the thermal detector is at room temperature, where the noise content of the image is dominated by the thermal radiation noise.…”
Section: Thz Detectorsmentioning
confidence: 99%
“…They measure the power of electromagnetic radiation indirectly via the temperature-dependent electrical resistance of the detector material, typically amorphous silicon, vanadium oxide, or silicon nitride. Microbolometers designed for infrared applications represent an established technology field, with typical resolutions of 640 × 480 pixels, even though arrays of up to 1280 × 960 pixels can be found [80]. For many practical applications, the scene imaged by the thermal detector is at room temperature, where the noise content of the image is dominated by the thermal radiation noise.…”
Section: Thz Detectorsmentioning
confidence: 99%
“…The specifications are summarized in Table 1. [2][3][4][5][6] The optics are very compact, but still provide enough room to insert a shutter for calibration purposes. Achieving good optical performance while allowing enough space for the shutter was a challenge for the optical design, as was reducing the effective thickness of the shutter.…”
mentioning
confidence: 99%