1994
DOI: 10.1117/12.162277
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1040 X 1040 infrared charge sweep device imager with PtSi Schottky-barrier detectors

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Cited by 11 publications
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“…In 1993, the 1040 × 1040 charge scanning device infrared FPA was developed by Mitsubishi Corporation of Japan. It is the first silicide array that can reach megapixels with the highest spatial resolution and minimum image . However, because of the low hot carrier emission efficiency of the metal material and the momentum mismatch between the electron states in the metal and Si of the silicide Schottky barrier photodetector, the responsivity (R) of these silicon-compatible devices is limited to less than 0.1 A/W. , …”
Section: Introductionmentioning
confidence: 99%
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“…In 1993, the 1040 × 1040 charge scanning device infrared FPA was developed by Mitsubishi Corporation of Japan. It is the first silicide array that can reach megapixels with the highest spatial resolution and minimum image . However, because of the low hot carrier emission efficiency of the metal material and the momentum mismatch between the electron states in the metal and Si of the silicide Schottky barrier photodetector, the responsivity (R) of these silicon-compatible devices is limited to less than 0.1 A/W. , …”
Section: Introductionmentioning
confidence: 99%
“…It is the first silicide array that can reach megapixels with the highest spatial resolution and minimum image. 4 However, because of the low hot carrier emission efficiency of the metal material and the momentum mismatch between the electron states in the metal and Si of the silicide Schottky barrier photodetector, the responsivity (R) of these silicon-compatible devices is limited to less than 0.1 A/W. 5,6 Compared with metal materials, graphene (Gr) has a longer hot carrier relaxation time and higher hot carrier temperature, which can achieve higher hot carrier emission efficiency.…”
Section: Introductionmentioning
confidence: 99%