Non-Destructive Model to Predict Commelina diffusa Leaf Area

Abstract

-Leaf length (L), leaf width (W), and leaf area (LA) were measured from 100 leaves aiming to determine a simple linear equation (Y=a*X) to predict the leaf area of Commelina diffusa, an important weed infesting annual and perennial crops in Brazil and worldwide. Results indicate the equation LA=0.7*LW reliably estimates the leaf area of C. diffusa, after correlating LA with LW, and then validating that equation by analyzing four new 25-leaf samples.Keywords: plant growth, biometry, non-destructive method, mathematical model, climbing dayflower. RESUMO -Comprimento da folha (C), largura da folha (L) e área foliar (AF) foram medidos em 100 folhas com o objetivo de determinar uma equação linear simples (Y=a*X) para estimar a área foliar de Commelina diffusa, importante planta daninha que infesta culturas anuais e perenes no Brasil e no mundo. Os resultados indicam que a equação AF=0,7*CL estima confiavelmente a área foliar de C. diffusa, após correlacionar AF com CL e, em seguida, proceder à validação da equação analisando quatro novas amostras de 25 folhas.Palavras-chave: crescimento de plantas, biometria, método não destrutivo, modelo matemático, trapoeraba.

Non-destructive method for estimating leaf area of Erythroxylum pauferrense (Erythroxylaceae) from linear dimensions of leaf blades

“…The determination coefficients (R²) were greater than 0.84, indicating that at least 84% variation in leaf area of E. pauferrense can be explained by the proposed equations. Also, the equations adjusted using the product of length by width (L.W) met the assumptions for estimating leaf area, thus best fitting the regression models (Carvalho et al, 2017b;Pezzini et al, 2018;Guimarães et al, 2019;Oliveira et al, 2019b), except for the exponential model, where best indexes were obtained using the product of length by length (L.L).…”