2017
DOI: 10.1590/1980-5373-mr-2016-0172
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Phases quantification in DP600 steel welded by GTAW process using SEM and atomic force microscopy

Abstract: The automotive industry is constantly under several challenges in many aspects, such as development of new materials and improvement their manufacturability. In order to achieve light weight, reduced emissions and ensure conductor safety, advanced high strength steels (AHSS) are able to fulfill these requirements. Dual phase steels (DP) are well suited for light weighing car body constructions. The gas tungsten arc welding (GTAW) process is focused in literature as an alternative choice for joining AHSS steels… Show more

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Cited by 5 publications
(2 citation statements)
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“…The great advantage of the AFM compared with SEM is the possibility of imaging surfaces in different environments, without any vacuum or special sample treatment, with very high resolution [29]. The multiphase samples should present at least three phases: PF, RA, and BF (and possibly also M), but they are not easy to identify in a large AFM scan area.…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%
See 1 more Smart Citation
“…The great advantage of the AFM compared with SEM is the possibility of imaging surfaces in different environments, without any vacuum or special sample treatment, with very high resolution [29]. The multiphase samples should present at least three phases: PF, RA, and BF (and possibly also M), but they are not easy to identify in a large AFM scan area.…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%
“…The concept used for the identification of phases and/or microconstituents is like used with SEM, exploiting the particularity of Nital to preferentially dissolve different phases and microconstituents present in multiphase steels, being able to generate topographic images that allow their morphology to be analyzed in detail. The great advantage of the AFM compared with SEM is the possibility of imaging surfaces in different environments, without any vacuum or special sample treatment, with very high resolution [29]. The multiphase samples should present at least three phases: PF, RA, and BF (and possibly also M), but they are not easy to identify in a large AFM scan area.…”
Section: Atomic Force Microscopy (Afm)mentioning
confidence: 99%