A study on the microstructural parameters of Zn (1-x)LaxZrxO nanopowders by X-ray line broadening analysis

Abstract

In the present study, the pure and La-Zr co-doped ZnO nanoparticles were prepared by sol-gel technique using zinc acetate dehydrate (Zn(Ac) 2 ·2H 2 O), lanthanum nitrate hexahydrate (La(NO 3 )3 ·6H 2 O) and zirconium chloride (ZrCl 4 ) as precursor. The structure and morphology of the prepared nanoparticle samples were studied using X-ray diffraction and transmission electron microscopy measurements. X-ray diffraction results indicated that all the samples have crystalline wurtzite phase. TEM showed that powder was polycrystalline in nature with random distribution of the pure and La-Zr doped ZnO nanoparticles. We demonstrate strain-size evaluations for pure and doped ZnO nanoparticles from the x-ray line profile analysis. The microstructural effects of crystalline materials in terms of crystallite sizes and lattice strain on the peak broadening were investigated using Williamson-Hall (W-H) analysis and size-strain plot (SSP) method. The average crystallite size of Zn (1-x) La x Zr x O nanoparticles estimated from the W-H analysis and SSP method varied as the doping concentration increased. The incorporation of Zr 4+ ion in the place of Zn 2+ caused an increase in the size of nanocrystals as compared to undoped ZnO. The average particle sizes of co-doped ZnO nanoparticles estimated from the USDM model is in good agreement with the TEM results.

Enhancement of heavy metal ion adsorption using electrospun polyacrylonitrile nanofibers loaded with ZnO nanoparticles

“…The strong anatase peaks of ZnO appeared at 2θ angles of 31°, 34°, and 36° corresponding to the (100), (002), and (101) crystallographic planes, respectively. Moreover, the diffractions of the (102), (110), (103), and (201) planes were observed at 2θ angles of 48°, 57°, 63°, and 67°, respectively …”

Effect of NiOx’s film thickness on the electrical properties of Ni/p–NiOx/n-Si structures

“…The crystallite size ( D ) of grown films has been estimated by using Scherer’s formula modified for micro-strain using Williamson–Hall (W–H) plots [26,27]. In this context, instrument corrected broadening ( βD) describing the diffraction peak of NiO x was determined using the following relation …”

“…As it is evident from the XRD diffractograms, 190-nm thick NiO x films exhibit broader peak compared with 300-nm thick NiO x films. The crystallite size (D) of grown films has been estimated by using Scherer's formula modified for micro-strain using Williamson-Hall (W-H) plots [26,27]. In this context, instrument corrected broadening (b D ) describing the diffraction peak of NiO x was determined using the following relation…”

A comparative study of the method of Williamson Hall and the pattern of cadmium oxide nanoparticles for X-rays

“…The nanoparticles Pure and La-Zr Co-doped ZnO were made by sol-gel techniques in Hossein Mahmoudi Chenari et al (2016). X-ray diffraction (XRD) and measurement of electron transmission microscopy (TEM).…”

“…Silver silicone nitride was installed on Ti6Al4V alloy in (2017), Umi Zalilah and R Mahmoodians [9] using magnetic sputter technics for physical vapor deposition. AgSiN is characterized by field emission spectroscopy, dispersive electron spectroscopy (EDS) and X-ray diffraction in the morphology, compound and structure of deposited and thermal treatment coats (XRD).…”