1/f noise in metallic thin films

Šikula, Josef; Schauer, Pavel; Vašina, Petr; Sikulova, M; Koktavy, B.; Chobola, Z.; Navarova, H.; Pazdera, Lubos

doi:10.1063/1.50886

Cited by 8 publications

(3 citation statements)

References 1 publication

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“…The exponent α could not be related to other parameters. Its distribution had a maximum at values slightly below 1, which confirms earlier findings on large ensembles of thin film resistors from multiple manufacturers [25] [26]. The suitability of NI as a quantitative indicator should be carefully considered for parts where α deviates strongly from unity and where the noise power is no longer equal per log unit of frequency bandwidth [23].…”

Section: Discussionsupporting

confidence: 81%

Measurement of Excess Noise in Thin Film and Metal Foil Resistor Networks

Beev¹

2021

Preprint

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Low-frequency resistance fluctuations cause excess noise in biased resistors. The magnitude of these fluctuations varies significantly between different resistor types. In this work measurements of excess noise in precision thin film and metal foil resistor networks are presented. The lowest levels were found in metal foil devices, followed by thin film NiCr networks deposited on silicon substrates. Higher excess noise with a significant spread between different types was seen in thin film devices deposited on ceramic substrates.

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Section: Discussionsupporting

confidence: 81%

Measurement of Excess Noise in Thin Film and Metal Foil Resistor Networks

Beev¹

2021

Preprint

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“…Noise spectroscopy and I-V characteristic non-linearity measurements are proposed as a diagnostic tool in order to characterize the sample bulk and contact quality, and to predict the mode of possible contact failure [14,15]. These are sensitive techniques for analysis of bulk and interface defects for determining the quality of devices.…”

Section: Introductionmentioning

confidence: 99%

Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors

Sita¹,

Sedláková²,

Majzner³

et al. 2013

Metrology and Measurement Systems

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Noise spectroscopy and I-V characteristic non-linearity measurement were applied as diagnostic tools in order to characterize the volume and contact quality of positive temperature coefficient (PTC) chip sensors and to predict possible contact failure. Correctly made and stable contacts are crucial for proper sensing. I-V characteristics and time dependences of resistance were measured for studied sensors and, besides the samples with stable resistance value, spike type resistance fluctuation was observed for some samples. These spikes often disappear after about 24 hours of voltage application. Linear I-V characteristics were measured for the samples with stable resistance. The resistance fluctuation of burst noise type was observed for some samples showing the I-V characteristic dependent on the electric field orientation. We have found that the thermistors with high quality contacts had a linear I-V characteristic, the noise spectral density is of 1/f type and the third harmonic index is lower than 60 dB. The samples with poor quality contacts show non-linear I-V characteristics and excess noise is given by superposition of g-r and 1/f n type noises, and the third harmonic index is higher than 60 dB.

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“…Some of the methods are used in different production stages [1][2][3], other during exploitation [4,5] or in a laboratory only [6] but still there are no universal methods which could be applied for cheap and widespread varistor quality monitoring in their work. The pros and cons of these methods as well as their further development will be described.…”

Section: Introductionmentioning

confidence: 99%

Problems of Varistor Quality Assessment During Exploitation

Smulko¹,

Olesz²,

Hasse³

et al. 2012

Metrology and Measurement Systems

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Varistors are commonly used elements which protect power supply networks against high-voltage surges or lightning. Therefore, quality and endurance of these elements is important to avoid losses when an expensive laboratory equipment would not be protected from random overvoltages. Additionally, excessive leakage currents generate serious costs due to high energy consumption. The paper presents shortly properties of varistors that comprized different ZnO grain types and can have various quality which changes continuously during exploitation (due to exposition to overheating and overvoltage pulses). Therefore, it is important to monitor varistors during their ageing (causing changes within their microstructures). A few methods of varistor property diagnosis were considered and compared with the methods currently applied in laboratory or industry applications. A new measurement (diagnostic) system that can monitor varistors during ageing and can be widely applied in power networks is presented. The proposed system fulfills requirements of the industrial customers which demand various methods for power line protection. The proposed system can be simply developed into a more advanced wireless diagnostic system of long power supply lines.

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1/f noise in metallic thin films

Cited by 8 publications

References 1 publication

Measurement of Excess Noise in Thin Film and Metal Foil Resistor Networks

Measurement of Excess Noise in Thin Film and Metal Foil Resistor Networks

Analysis of Noise and Non-Linearity of I-V Characteristics of Positive Temperature Coefficient Chip Thermistors

Problems of Varistor Quality Assessment During Exploitation

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