1999 Symposium on VLSI Technology. Digest of Technical Papers (IEEE Cat. No.99CH36325)
DOI: 10.1109/vlsit.1999.799322
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0.18 μm metal gate fully-depleted SOI MOSFETs for advanced CMOS applications

Abstract: We report here for the first time a 0.18ym fully-depleted SO1 process with PVD TiN metal gate. Because midgap work function metal gate and very light channel doping were used, threshold voltage can he easily controlled in +300mV to +5OOmV range and on-wafer Vt variation was only about Results and Discussions +5mV. Short channel effects can be further improved when a) Vt and Subthreshold Slope silicon film thickness is thinner than 300A. Subthreshold Vts can be easily controlled in the +300mV to +500mV slope wa… Show more

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Cited by 9 publications
(3 citation statements)
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“…There are several literature examples of successful integration of mid-gap metal gate transistors, including SiGe, Ta , and TiN. (12)(13)(14)(15)(16)(17) A metal gate stack typically consists of a thin metal layer sandwiched between a thicker polysilicon layer above, and the gate dielectric below. The gate dielectric may be a conventional SiO 2 or SiON gate oxide, or a high-k gate dielectric such as HfSiON.…”
Section: Gate Materialsmentioning
confidence: 99%
“…There are several literature examples of successful integration of mid-gap metal gate transistors, including SiGe, Ta , and TiN. (12)(13)(14)(15)(16)(17) A metal gate stack typically consists of a thin metal layer sandwiched between a thicker polysilicon layer above, and the gate dielectric below. The gate dielectric may be a conventional SiO 2 or SiON gate oxide, or a high-k gate dielectric such as HfSiON.…”
Section: Gate Materialsmentioning
confidence: 99%
“…Therefore, a workfunction-engineered mid-gap metal gate material [10], [16], [17] should be used to provide symmetric threshold voltages for NMOS and PMOS. There are several literature examples of successful integration of mid-gap metal gate transistors, including SiGe [15], Ta [10], [18], and TiN [19]- [26].…”
Section: Gate Fabricationmentioning
confidence: 99%
“…2 Therefore, the combination of the advantages of the metal gate with the high-dielectric-constant ͑high-k͒ gate dielectric would be an attractive technology option for the advanced MOS devices applications. 1 However, the MOS devices with the conventional dual-poly gate electrodes are not suitable for the advanced memory and logic applications.…”
mentioning
confidence: 99%