Conference Proceedings. 2001 International Conference on Indium Phosphide and Related Materials. 13th IPRM (Cat. No.01CH37198)
DOI: 10.1109/iciprm.2001.929087
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0.1 μm enhancement-mode pseudomorphic InGaAs/InAlAs/InP HEMT

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Cited by 3 publications
(5 citation statements)
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“…Buried-Pt gates have been utilized to achieve high Schottky barrier height, B , as well as to reduce d d . 1,3,5,6) Strained In 0:45 Al 0:55 As/In 0:75 Ga 025 As heterostructures have also been employed to achieve high barrier height with Ti/Pt/Au gate metallization, because B is the higher for In x Al 1Àx As with higher Al content. 6) In the present study, the thickness of heterostructures has been scaled down (d d scaling) to achieve positive threshold voltage, utilizing Ti/Pt/Au metallization, which has better reliability performance than the buried-Pt gate although its barrier height, B , is lower than that of buried-Pt gates.…”
Section: Layer Structure Designmentioning
confidence: 99%
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“…Buried-Pt gates have been utilized to achieve high Schottky barrier height, B , as well as to reduce d d . 1,3,5,6) Strained In 0:45 Al 0:55 As/In 0:75 Ga 025 As heterostructures have also been employed to achieve high barrier height with Ti/Pt/Au gate metallization, because B is the higher for In x Al 1Àx As with higher Al content. 6) In the present study, the thickness of heterostructures has been scaled down (d d scaling) to achieve positive threshold voltage, utilizing Ti/Pt/Au metallization, which has better reliability performance than the buried-Pt gate although its barrier height, B , is lower than that of buried-Pt gates.…”
Section: Layer Structure Designmentioning
confidence: 99%
“…It has been reported that thermal annealing of gate metallization increased the Schottky barrier height of the gate metal and reduced the effective Schottky layer thickness. 1,3,5) Schottky barrier height enhancement induces threshold voltage shift without changing the peak transconductance value, whereas, gate metal diffusion into the semiconductor layer results in the enhancement of peak transconductance values as well as threshold voltage shift. Compared with Pt/Ti/Pt/Au gate metallization, Ti/Pt/Au metallization resulted in a smaller threshold voltage shift and a smaller increase in transconductance, which indicate that the penetration depth of Ti is less than that of Pt and the enhancement of the Schottky barrier height is also less with Ti/Pt/Au metallization.…”
Section: Characterizationmentioning
confidence: 99%
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“…Introduction: Thermally-treated Pt-based metallisation is commonly utilised as the Schottky gate contact in enhancement-mode InAlAs= InGaAs high electron mobility transistors (eHEMTs) owing to its high Schottky barrier height [1][2][3][4][5]. However, the rapid diffusion of Pt in InAlAs has constituted a reliability issue [6] since it alters crucial device parameters such as transconductance, threshold voltage, and gate capacitance.…”
mentioning
confidence: 99%