Integral expressions for the reflectance and transmittance spectra of the structure consisted of two thin layers deposited on opposite faces of a plane-parallel substrate at oblique illumination of the structure with partially coherent light are obtained. As a result of the asymptotic analysis of the integrals, approximate analytical formulae are established for calculating the indicated spectra, convenient for use in solving inverse spectrophotometry problems. An aluminum doped zinc oxide layer deposited on a glass substrate is studied. The spectra of the refractive index and absorption coefficient of the layer and the substrate, as well as the thickness of the layer, are determined by processing the reflectance and transmission spectra of the structure, measured for s- and p- polarized waves at two angles of light incidence. The found parameters are used in computational experiments to estimate the applicability limits of the formulated approximations.
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