Методами ИК спектроскопии и сканирующей электронной микроскопии (СЭМ) исследована морфология высокопористых пленок на основе полиэтилена высокой плотности (ПЭВП) с различным диаметром пор. С помощью метода СЭМ построены гистограммы распределения пор по размерам. Аналогичные гистограммы получены с помощью метода ИК спектроскопии. Установлено хорошее согласие между данными двух независимых методов, что подтверждает возможность использования метода ИК спектроскопии для характеристики наличия и размеров пор в микронном диапазоне для полимерного образца. The morphology of highly porous films based on high-density polyethylene (HDPE) with different pore diameters was studied by IR spectroscopy and scanning electron microscopy (SEM). Using the SEM method, histograms of pore size distribution were constructed. Similar histograms were obtained using the IR spectroscopy method. A good agreement between the data of two independent methods was established, which confirms the possibility of using the IR spectroscopy method to characterize the presence and size of pores in the micron range for a polymer sample.
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