This paper provides an accurate modeling method for the photovoltaic panel using Matlab software. The mathematical model discusses the effect of the environmental factors on PV panels. The model based on specifications given on the manufacturer's plate, a previous Simulink model was developed using Matlab code, to include the effect of humidity on the solar cell performance and efficiency. In the previous work on P-V characteristics, the temperature effect is discussed adequately, without mention the humidity side effects. In this paper, the effect of humidity on the fill factor and efficiency of solar cells is discussed. The conclusions come with many side effects of the humidity on the solar cell, which is the sediments trapped by water molecules, and energy loss due to the reflections of light from the condensed water surface. In addition to the heat carried by moister. The effect of this kind of heat has been studied through calculating the enthalpy of the moist air, and feel like temperature). According to this model and in Silicon solar cell, the lost energy due to reflection was equal to (G ave =842.0175 w/m 2 ) on average. Due to this loss, solar cell current and voltage will be different. All these effects lead to a decrease in the fill factor and the efficiency of the solar cell, because of a reduction in the absorbing energy.
Theoretical study using mathematical analysis supported by Matlab code was created, for Silicon dioxide (SiO 2) thin films on various substrate materials (Aluminium, quartz, and silicon), and different thicknesses. Reflectance and transmittance of the (SiO 2) thin film is strongly dependent on the electromagnetic wavelength. Many physical results were obtained. The results obtained serve as an illustration of the feasibility of simple techniques in measuring precisely the reflectance and absorptance of the (SiO 2) thin film with an error not exceeding 0.1%. The reflectance and absorptance characteristics of multilayer thin film are strongly dependent on the wavelength of the electromagnetic waves. The effects of various substrate materials on the reflectance characteristics have been investigated by evaluating the reflectance curves of SiO 2 thin films with thickness in the range of (100-1000) nm. The amplitude and periodicity of reflectance and absorptance changed with wavelength. Also the periodicity of this variety change with the film thickness and with the substrate material. In multilayer thin-film devices, the amount of light reflected at each interface can be adjusted by adjusting many factors like film thickness and substrate materials. beams phase can be adjusted by changing the layer thickness. There are thus two parameters associated with each layer, thickness and refractive index difference between film and substrate materials, which can be chosen to give the required performance.
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