A predetermined relationship between open circuit voltage (OCV) and state of charge (SoC) is the premise of model-based SoC estimation algorithms. Commonly used OCV tests to obtain the offline OCV-SoC curves include the low current OCV test and the incremental OCV test. In this paper, in addition to comparing the low current OCV test with the incremental OCV test which applies 0.5 C current-rate, the incremental OCV tests which apply 0.2, 0.3, and
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