A new approach to the security analysis of hardware-oriented masked ciphers against second-order side-channel attacks is developed. By relying on techniques from symmetric-key cryptanalysis, concrete security bounds are obtained in a variant of the probing model that allows the adversary to make only a bounded, but possibly very large, number of measurements. Specifically, it is formally shown how a boundedquery variant of robust probing security can be reduced to the linear cryptanalysis of masked ciphers. As a result, the compositional issues of higher-order threshold implementations can be overcome without relying on fresh randomness. From a practical point of view, the aforementioned approach makes it possible to transfer many of the desirable properties of first-order threshold implementations, such as their low randomness usage, to the second-order setting. For example, a straightforward application to the block cipher LED results in a masking using less than 700 random bits including the initial sharing. In addition, the cryptanalytic approach introduced in this paper provides additional insight into the design of masked ciphers and allows for a quantifiable trade-off between security and performance.
Meaurements of solar flare spectra have allowed the electric field strengths in two flares to be determined, using the Inglis-Teller formula. Further, an independently estimated value for the electron density has allowed the two components of this field, that is, the interionic component and the external component that arises, for example, through plasma instabilities, to be separately extracted. External electric field strengths ~ 0.5 kV cm -i for a limb flare and ~ 1.3 kV cm -1 for a white-light flare are found. Estimates of electric fields strengths generated by the resistive magnetic tearing instability indicate that this process could account for a significant part of the electric field if pre-existing magnetic field strengths in the flaring regions are characterized by a few kilogauss. Other plasma processes probably contribute measurably as well.
A coplanar electrode array sensor is established for the imaging of composite-material adhesive-layer defect detection. The sensor is based on the capacitive edge effect, which leads to capacitance data being considerably weak and susceptible to environmental noise. The inverse problem of coplanar array electrical capacitance tomography (C-ECT) is ill-conditioning, in which a small error of capacitance data can seriously affect the quality of reconstructed images. In order to achieve a stable image reconstruction process, a redundancy analysis method for capacitance data is proposed. The proposed method is based on contribution rate and anti-interference capability. According to the redundancy analysis, the capacitance data are divided into valid and invalid data. When the image is reconstructed by valid data, the sensitivity matrix needs to be changed accordingly. In order to evaluate the effectiveness of the sensitivity map, singular value decomposition (SVD) is used. Finally, the two-dimensional (2D) and three-dimensional (3D) images are reconstructed by the Tikhonov regularization method. Through comparison of the reconstructed images of raw capacitance data, the stability of the image reconstruction process can be improved, and the quality of reconstructed images is not degraded. As a result, much invalid data are not collected, and the data acquisition time can also be reduced.
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