A simple expression for the yield strength of a thin polycrystalline film attached to a substrate and with a passivated layer has been derived from a relationship between stress work for dislocation moving and strain energy. It is shown that, the yield strength of a polycrystalline film is determined by two affecting factors (orientation of grains and type of dislocations) and three strengthening factors (passivated layer strengthening, substrate strengthening, and grainsize strengthening). Predictions from the expression are in agreement with reported experimental results. This shows that the model is reasonable.
A theoretical model is proposed for the abnormal grain growth in thin films of columnar grains. In addition to the grain boundary energy usually considered for the grain growth in bulk materials, the influences of surface energy, interface energy and strain energy are also considered in the model. A reviewed analysis is given out for the anisotropy of energy. For fcc and bcc metal films, surface energy minimization generally favours (111) and (110) textures, while strain energy minimization generally favours (110) and (100) textures.
scite is a Brooklyn-based organization that helps researchers better discover and understand research articles through Smart Citations–citations that display the context of the citation and describe whether the article provides supporting or contrasting evidence. scite is used by students and researchers from around the world and is funded in part by the National Science Foundation and the National Institute on Drug Abuse of the National Institutes of Health.