We compare experimental fluctuation electron microscopy (FEM) speckle data with electron diffraction simulations for thin amorphous carbon and silicon samples. We find that the experimental speckle intensity variance is generally more than an order of magnitude lower than kinematical scattering theory predicts for spatially coherent illumination. We hypothesize that decoherence, which randomizes the phase relationship between scattered waves, is responsible for the anomaly. Specifically, displacement decoherence can contribute strongly to speckle suppression, particularly at higher beam energies. Displacement decoherence arises when the local structure is rearranged significantly by interactions with the beam during the exposure. Such motions cause diffraction speckle to twinkle, some of it at observable time scales. We also find that the continuous random network model of amorphous silicon can explain the experimental variance data if displacement decoherence and multiple scattering is included in the modeling. This may resolve the longstanding discrepancy between X-ray and electron diffraction studies of radial distribution functions, and conclusions reached from previous FEM studies. Decoherence likely affects all quantitative electron imaging and diffraction studies. It likely contributes to the so-called Stobbs factor, where high-resolution atomic-column image intensities are anomalously lower than predicted by a similar factor to that observed here.

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We present a novel method for calculating interface curvature on 3D unstructured meshes from piecewiselinear interface reconstructions typically generated in the volume of fluid method. Interface curvature is a necessary quantity to calculate in order to model surface tension driven flow. Curvature needs only to be computed in cells containing an interface. The approach requires a stencil containing only neighbors sharing a node with a target cell, and calculates curvature from a least-squares paraboloid fit to the interface reconstructions. This involves solving a 6 × 6 symmetric linear system in each mixed cell. We present verification tests where we calculate the curvature of a sphere, an ellipsoid, and a sinusoid in a 3D domain on regular Cartesian meshes, distorted hex meshes, and tetrahedral meshes. For both regular and unstructured meshes, we find in all cases the paraboloid fitting method for curvature to converge between first and second order with grid refinement. * Corresponding author: zjibben@lanl.gov 1 arXiv:1712.05467v1 [physics.comp-ph]