We measure the current-voltage (I-V) curves of intrinsic Josephson junctions (IJJs) in misaligned Tl 2 Ba 2 Ca Cu 2 O 8 thin films embedded in a Fabry-Pérot (F-P) resonator at liquid nitrogen temperature. Regarding the substrate as a dielectric resonator, electromagnetic coupling between the intrinsic Josephson junctions is improved. By adjusting the location of the substrate in the F-P resonator, the critical current of the IJJs under microwave irradiation (75.6 GHz) is suppressed almost to zero. Two pairs of symmetrical radiation (75.6 GHz) peaks are detected. Possible explanations for this experimental result are discussed.
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