Recent studies show that emotion is a mechanism for fast decision-making in human and other animals. Mathematical models have been developed for describing emotion in mammals. These models, similar to other bioinspired models, must be implemented in embedded platforms for industrial and real applications. In this paper, brain emotional learning based intelligent controller, which is based on mammalian middle brain, is designed and implemented on field-programmable gate arrays, and this emotional controller is applied for controlling of laboratorial overhead traveling crane in model-free and embedded manner. The main features of this controller are leaning capability, providing a model-free control algorithm, robustness and the ability to respond swiftly. By designing appropriate stress signals, a designer can implement a proper trade among control objectives.
TIS is an instruction-level methodology for processor core self-testing that enhances instruction set of a CPU with test instructions. Since the functionality of test instructions is the same as the NOP instruction, NOP instructions can be replaced with test instructions. Online testing can be accomplished without any performance penalty. TIS tests different parts of the processor and detects stuck-at faults. This method can be employed in offline and online testing of single-cycle, multicycle and pipelined processors. But, TIS is more appropriate for online testing of pipelined architectures in which NOP instructions are frequently executed because of data, control and structural hazards. Running test instructions instead of these NOP instructions, TIS utilizes the time that is otherwise wasted by NOPs. In this article, two different implementations of TIS are presented. One implementation employs a dedicated hardware modules for test vector generation, while the other is a software-based approach that reads test vectors from memory. These two approaches are implemented on a pipelined processor core and their area overheads are compared. To demonstrate the appropriateness of the TIS test technique, several programs are executed and fault coverage results are presented.
Arithmetic circuits require a verification process to prove that the gate level circuit is functionally equivalent to a high level specification. This paper presents an automatic equivalence checking technique to verify combinational arithmetic circuits at bit level. In order to efficiently verify gate level arithmetic circuits, we make use of computer algebra based approach so that the circuit and the specification are modeled in polynomial system and the verification problem is formulated as polynomial reduction techniques using Groebner basis of circuit polynomial corresponding ideal. To overcome costly Groebner basis computation as well as intensive polynomial reduction, we make use of a canonical decision diagram named Horner Expansion Diagram (HED), derive a suitable term order to represent and manipulate polynomials efficiently and find repetitive components based on automata. To evaluate the effectiveness of our verification technique, we have applied it to very large arithmetic circuits including multipliers. Preliminary experimental results show that the proposed verification technique is scalable enough so that large multipliers can efficiently be verified in reasonable run time and memory usage.
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