This paper discusses the fundamentals, applications, potential, limitations, and future perspectives of polarized light reflection techniques for the characterization of materials and related systems and devices at the nanoscale. These techniques include spectroscopic ellipsometry, polarimetry, and reflectance anisotropy. We give an overview of the various ellipsometry strategies for the measurement and analysis of nanometric films, metal nanoparticles and nanowires, semiconductor nanocrystals, and submicron periodic structures. We show that ellipsometry is capable of more than the determination of thickness and optical properties, and it can be exploited to gain information about process control, geometry factors, anisotropy, defects, and quantum confinement effects of nanostructures.
Ce(1-x)Pr(x)O(2-δ) (0 ≤ x ≤ 0.4) nanocrystals were synthesized by self-propagating method and thoroughly characterized using X-ray diffraction, Raman and X-ray photoelectron spectroscopy and magnetic measurements. Undoped CeO₂ nanocrystals exhibited intrinsic ferromagnetism at room temperature. Despite the increased concentration of oxygen vacancies in doped samples, our results showed that ferromagnetic ordering rapidly degrades with Pr doping. The suppression of ferromagnetism can be explained in terms of the different dopant valence state, the different nature of the vacancies formed in Pr-doped samples and their ability/disability to establish the ferromagnetic ordering.
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