Graphene provides a promising materials platform for fundamental studies and device applications in plasmonics. Here we investigate the excitation of THz plasmon polaritons in large-area graphene samples on standard oxidized silicon substrates, via diffractive coupling from an overlying periodic array of metallic nanoparticles. Pronounced plasmonic absorption features are measured, whose frequencies can be tuned across a large portion of the THz spectrum by varying the array period. At the same time, the ability to tune these resonances actively via electrostatic doping is found to be strongly limited by the presence of large carrier density variations across the sample area induced by the underlying SiO 2 , which are measured directly by Raman microscopy. These results highlight the importance of minimizing charge "puddles" in graphene plasmonic devices, e.g., through the use of more inert substrates, in order to take full advantage of their expected dynamic tunability for applications in THz optoelectronics.
Graphene is a promising materials system for basic studies and device applications in THz optoelectronics with several key functionalities, including photodetection and optical modulation, already demonstrated in recent years. The use of plasmonic excitations in this context is particularly attractive by virtue of their dynamic gate tunability across the far-infrared spectrum, relatively long lifetimes, and highly subwavelength confinement. Here these favorable properties are exploited for the generation of narrowband tunable THz radiation from current-driven plasmonic oscillations. We employ arrays of graphene nanoribbons, where localized plasmonic resonances are excited by an injected electrical current (through the generation and subsequent energy relaxation of hot carriers) and then radiate into the far field. Pronounced emission peaks are correspondingly measured at tunable frequencies across a wide portion of the THz spectrum (4–8 THz), controlled by design through the ribbon width and actively through the applied gate voltage. These results provide a new path for the study of plasmonic and hot-carrier phenomena in graphene and are technologically relevant for the development of highly miniaturized and broadly tunable THz radiation sources.
In this article, a wide‐band and polarization‐insensitive perfect absorber composed of 4 sandwiched layers of dielectric and metal disks is introduced. Compared to classical perfect absorbers, the system supports near‐unity absorption within a wider spectral window through multiple perfect absorption mechanisms that exist due to a constituting inter‐metal disk, functioning either as a dipolar antenna or a conducting ground for different perfect absorption mechanisms. Circular shape of the antenna makes the working mechanism of the system polarization insensitive. The working principle of the system is investigated through near‐ and far‐field calculations by finite difference time domain (FDTD) simulations. A fine‐tuning mechanism of the wide‐range perfect absorption window is introduced through geometrical device parameters. The multilayer perfect absorber system is fabricated through a high‐quality fabrication method based on electron beam lithography, lift‐off method, and multi‐step deposition of metal and dielectric layers. The spectral behavior of the perfect absorber system is finally experimentally investigated through Fourier transform infrared (FTIR) spectroscopy.
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