A streak-camera system for the observation of high-speed crystallization processes induced by laser irradiation in phasechange (PC) recording materials has been developed. A distinct difference in the time-sequential development of the crystallized region was observed in two different types of PC materials, i.e., Sb 78 Te 22 (eutectic composition) and Ge 2 Sb 2 Te 5 (pseudobinary alloy) films. Taking into account a thermal simulation analysis, the observed difference is interpreted in terms of the different crystallization process. It is concluded that Sb 78 Te 22 , which is a growth-dominant film, is suitable for highspeed high-density recording.
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