In the quest for an efficient optical absorption of broad-band solar irradiation, intermediate-band solar cells composed of wide-bandgap semiconductors have attracted attention. In the present study, we developed and investigated the performance of wide-bandgap InGaP-based InP quantum dot (QD) solar cells. The solar cells were fabricated by solid-source molecular beam epitaxy, and their optical absorption range was found to be up to >850 nm, which is larger than the >680 nm optical absorption range of the host InGaP solar cells. Through the measurements of the voltage-dependent quantum efficiency, the photocarriers generated in the InGaP host were determined to be captured into the InP QDs, rather than expelled from the solar cells. The findings of this study highlight the need for the development of an optimized structure of intermediate-band solar cells to mitigate the capture of the photocarriers.
In an ideal intermediate-band (IB) concept, the host semiconductor generates current by absorbing short-wavelength light and the IB is used to absorb long-wavelength light. Here, we investigate the impact of the host absorber thickness at the front side of the cells on the properties of InGaP-based InP quantum dot (QD) solar cells. We prepared the InGaP-based InP QD cells with the front i-InGaP layer and compared them with the cells without the front i-InGaP layer. The insertion of the front i-InGaP layer results in an increase in quantum efficiency in the visible region, indicating that the short-wavelength light absorbed at the InGaP host increases the short-circuit current density in the cell. In addition, a thick host layer leads to reduced quantum efficiency below the host bandgap energy, which indicates that the thermal escape from QDs is suppressed. These results indicate that the optimization of the host semiconductor thickness is critical for achieving the ideal operation of the IB concept in the QD solar cells.
We report high-quality dual-junction GaAs solar cells grown using solid-source molecular beam epitaxy and their application to smart stacked III-V//Si quadruple-junction solar cells with a two-terminal configuration for the first time. A high open-circuit voltage of 2.94 eV was obtained in an InGaP/GaAs/GaAs triple-junction top cell that was stacked to a Si bottom cell. The short-circuit current density of a smart stacked InGaP/GaAs/ GaAs//Si solar cell was in good agreement with that estimated from external quantum efficiency measurements. An efficiency of 18.5% with a high open-circuit voltage of 3.3 V was obtained in InGaP/GaAs/GaAs//Si two-terminal solar cells.
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