Through-hole (TH) filling of a printed circuit board (PCB) was conducted with a copper electroplating solution. Tetranitroblue tetrazolium chloride (TNBT) was used as an inhibitor and acetic acid electrolyte instead of a traditional H2SO4 electrolyte was used for the copper electroplating. Moreover, functional insoluble anodes (DT) that were activated with iridium-based mixed metal oxides on Ti meshes were used instead of conventional soluble anodes (i.e., P-doped Cu). The TH filling performance of the copper electroplating solution was significantly enhanced when acetic acid electrolyte and DT anodes were used simultaneously in the copper electroplating bath.
A nickel-tungsten alloy plating formula was developed to electrochemically fill the microvias of printed circuit boards and the through-silicon vias (TSVs) of wafers. The plating solution was composed of Ni(SO 3 NH 2 ) 2 , citric acid, sodium citrate, Na 2 WO 4 , chloride ions, and 2-mercapto-5-benzimidazolesulfonic acid. A void-free Ni-W superfilling of a microvia and a TSV were achieved. The tungsten content in the filled alloy varied from 1.5 atom% to 5.5 atom%, depending on the plating temperature. The coefficient of thermal expansion of the filled Ni-W was theoretically calculated according the tungsten content, which was lower than that of copper. Microvia filling by copper electroplating has been widely employed to fabricate state-of-the-art printed circuit boards (PCBs) for interconnection, especially for integrated circuit (IC) packaging substrates.1-5 Recently, through-silicon vias (TSVs) have also been metallized by copper electroplating for the interconnection of threedimensional (3D) IC chip stacking packaging. [6][7][8][9][10][11][12][13] Copper is a good conductor but its coefficient of thermal expansion (CTE) is high. Therefore, issues related to CTE mismatch between the conducting materials and the dielectric materials arise in PCB and 3D packaging with high-density interconnections.Numerous authors have reported that the high CTE of the copper filled in the TSVs results in stress impacts on silicon substrates. [14][15][16][17] Copper atoms diffuse from the TSV due to thermal cycling, leading to void formation in the TSV. 18,19 The copper protrusion on the TSV caused respectively by thermal expansion and diffusion of copper lattices and atoms may destroy stacked IC chips. [20][21][22] Copper must be replaced by tungsten 23 or nickel 24,25 to overcome the issue of CTE mismatch.Although the CTE of tungsten is very low, 14,26 it cannot be electrochemically plated in an aqueous electrolyte. Fortunately, tungsten can be induced to co-deposit with nickel. [27][28][29][30][31][32] In this work, a Ni-W alloy plating formula that can achieve Ni-W bottom-up filling of microvia was developed. This plating formula can fill the microvia of PCBs and can also fill TSVs. The Ni-W filled TSVs exhibit good thermal stability after being annealed at 500• C for 4 h. ExperimentalThe dimensions of the PCB fragments cut for the Ni-W filling plating were 4.2 × 6.0 cm 2 . The microvias were formed by CO 2 laser ablation. The diameter and depth of the microvias were 80 μm and 40 μm, respectively. The sidewalls of the microvias were metallized by electroless copper plating in advance to deposit a 2-3 μm thick layer of copper before the filling plating.TSVs were formed by a deep reactive ion etching (DRIE) process (i.e., the Bosch process). The thickness of the isolation layer (i.e., SiO 2 ) in the TSVs formed by thermal oxidation was approximately 1-3 × 10 3 Å. The barrier layer was a TiN film with a thickness of 500 Å, which was conformably deposited by atomic layer deposition (ALD) for 600 cycles. The seed layer was depo...
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