Absbnrr-Thk paper desscriks an error annlysis and performance messment for one-terminal and two-terminal fault locations for series compensated parallel lines, utilizing impedance messurement techniques. The one-terminal fault location method, employing only local currents and voltages, is considerably influenced by the serifs capacitors in series compensated parallel lines. Two major factors which influence one-terminal fault location have cope to light One is the voltage and current components of sub harmonic resonance which are close tn the fundamental frequency and are generated when faults occur in series compensated parallel lines. The other is the phase angle difference of the fault current between the fault point and the measuring point These factors increase the h a t i n g error considerably. The mechanism x explained in detail in the paper.The transient solution of the linearcircuit equation of the series compensated parallel lines b obtained and it shows that the result coincides with the simulation bssod on the EMTP model for series compensated parallel lines. Furthermore, two-terminal fault location using the data from both tenninnls is messed. A location method wing positiveiequence components is simulated with an EMTP model for the Lines and shows good location accuracy.
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