In the displacement measurement of the wafer stage in lithography machines, signal quality is affected by the relative angular position between the encoder head and the grating. When the measurement orientation is tangential to the center of the chuck, the influence of the homogeneous expansion of the chuck on the measurement can be reduced. In this research, we propose a reflective two-dimensional metal dielectric grating based on frustum array. With an incident azimuth angle of 45°, the (-1, -1) order diffraction efficiencies of transverse electric polarization (TE) and transverse magnetic polarization (TM) are 81.4% and 84.8% at 1550 nm incident wavelength under Littrow mounting, respectively. the diffraction efficiency balance is 95.99%. The high efficiency of TE and TM polarization makes them have great application potential in grating displacement measurement. Furthermore, the structure based on the frustum of a cone performs well in manufacturing tolerance, which provides possibility for practical applications.
This paper introduces a new device for one-dimensional grating period measurement with high accuracy. The scheme includes two subsystems: a grating interferometer and a laser interferometer. As the grating moves, the grating interferometer obtains periodic signal related to the grating period, while the laser interferometer measures the displacement simultaneously. The grating period is then obtained through data processing and least-square-fitting. Most of the grating period measurement devices have scattered structures, poor stability, which could be affected by the environment easily. In order to overcome this shortcoming, we adopt the structure of glued prisms, which is compact, and will significantly improve the stability of the system. Thus, the scheme has advantages in measurement accuracy as well as resolution. The system benefits from simple structure and cheap components, which can be widely used in grating period measurement technology.
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