With the increasing marketplace demand for decreasing test time and cost, constant-stress accelerated life testing (CSALT) is widely used for reliability demonstration in practice. The existing accelerated acceptance sampling plans (AASPs) do not consider the uncertainty of accelerated factor (AF), which makes it difficult to accurately describe the producer's and consumer's risks. Previous AASP studies on CSALT were mainly carried out under a fixed accelerated stress level, and the influence of accelerated stress level is not concerned. Therefore, considering the uncertainty of AF and taking the lognormal distribution as an example, the AASP design method with time-censoring is proposed, where the life-stress relationship between the location parameter and stress level is expressed by an inverse power law model. First, considering the uncertainty of AF expressed by a distribution, the acceptance probability can be obtained by the mathematic expectation of conditional acceptance probability, and the producer's and consumer's risks can be accurately expressed. Then, to reduce the total cost furtherly, the accelerated stress level is considered as a new decision variable, the optimum AASP including the sampling plan and the decisionmaking criterion can be designed by minimizing the total cost and solving the risk constraint equations of both sides. A real case study of white organic light-emitting diodes is carried out to verify the effectiveness of the proposed method.