Optimizing performance of fullerene-based small-molecule bi-layer organic photovoltaic devices.

Time-of-flight (TOF) measurements typically require a sample thickness of several micrometers for determining the carrier mobility, thus rendering the applicability inefficient and unreliable because the sample thicknesses are orders of magnitude higher than those in real optoelectronic devices. Here, we use subphthalocyanine (SubPc):C70 as a charge-generation layer (CGL) in the TOF measurement and a commonly hole-transporting layer, N,N’-diphenyl-N,N’-bis(1,1’-biphenyl)-4,4’-diamine (NPB), as a standard material under test. When the NPB thickness is reduced from 2 to 0.3 μm and with a thin 10-nm CGL, the hole transient signal still shows non-dispersive properties under various applied fields, and thus the hole mobility is determined accordingly. Only 1-μm NPB is required for determining the electron mobility by using the proposed CGL. Both the thicknesses are the thinnest value reported to data. In addition, the flexibility of fabrication process of small molecules can deposit the proposed CGL underneath and atop the material under test. Therefore, this technique is applicable to small-molecule and polymeric materials. We also propose a new approach to design the TOF sample using an optical simulation. These results strongly demonstrate that the proposed technique is valuable tool in determining the carrier mobility and may spur additional research in this field.

In this study, we compared the use of neat bathocuproine (BCP) and BCP:C60 mixed buffer layers in chloroboron subphthalocyanine (SubPc)/C60 bilayer organic photovoltaic (OPV) devices and analyzed their influence on device performance. Replacing the conventional BCP with BCP:C60 enabled manipulating the optical field distribution for optimizing the optical properties of the devices. Estimation of the interfacial barrier indicated that the insertion of the BCP:C60 between the C60 and electrode can effectively reduce the barrier for electrons and enhance electron collection at the electrode. Temperature-dependent measurements of the OPV devices performed to calculate the barrier height at the SubPc/C60 interface suggested that band bending was larger when the BCP:C60 buffer layer was used, reflecting increased exciton dissociation efficiency. In addition, the device lifetime was considerably improved when the BCP:C60 buffer layer was used. The device performance was stabilized after the photodegradation of the active layers, thereby increasing the device lifetime compared with the use of the neat BCP buffer layer. Atomic force microscopy images showed that the neat BCP was easily crystallized and could degrade the cathodic interface, whereas the blend of C60 and BCP suppressed the crystallization of BCP. Therefore, the optimal buffer layer improved both the device performance and the device lifetime.

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