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The full development of the equations for defocused digital particle image velocimetry as proposed by Kajitani and Dabiri (2005 Meas. Sci. Technol. 16 790-804) predefined a finite area at the focal plane to be imaged onto the CCDs. This resulted in bounded overlapping viewing cones of the lenses, i.e. the observable domain, within which a tetrahedral imaging volume was defined. The resulting ray tracing suggested that the observable domain would not be fully imaged onto the CCDs. Furthermore, the tetrahedral imaging volume, which was also a definition used to develop the characteristic three-dimensional DDPIV equations, only represented a limited portion of the observable domain. It is shown that by avoiding these incorrect definitions, a more accurate description of the three-dimensional DDPIV measurement system can be developed by introducing a new measurement volume based on the CCD dimensions, which replaces the tetrahedral volume, as well as introducing a new system optical axis. Lastly, a geometric uncertainty analysis is conducted and compared to the results found by Kajitani and Dabiri.

We fabricated continuous highly (110)/(101)-oriented β-FeSi2 films on Si (111) substrates by the facing-target sputtering method. An epitaxial thin β-FeSi2 template buffer layer preformed on the silicon substrate was found to be essential in the epitaxial growth of thick β-FeSi2 films. It was proved that the template reduced the iron diffusion into the silicon substrate during thick β-FeSi2 film fabrication. Even though the annealing was performed at high temperature (880 °C) for a long duration (10 h), iron diffusion was effectively hindered by the template. By introducing this template buffer layer, an abrupt interface without appreciable defects between the β-FeSi2 film and the silicon substrate formed. The mechanism for the reduction of iron diffusion by the template buffer layer is discussed.