The dense attachment of silver nanoparticles (AgNPs) on indium tin oxide (ITO) surfaces was successfully synthesized and developed using a refined seed-mediated growth approach (RSMG). AgNPs/ITO film prepared was investigated using several methods such as UV-visible spectroscopy, field emission scanning electron microscope, optical absorption, electrochemical impedance spectroscopy and cyclic voltammeter, respectively. The AgNPs was attached on the ITO surface via the cysteamine molecule. Particle size and density of AgNPs/ITO film have been examined and discussed in detail. The results obtained by refined seed-mediated growth showed a narrower size distribution and much denser attachment compared with those prepared by the normal seed-mediated growth method. The particles size of Ag nanosphere have been controlled by adjusting the growth time at less than 2h, while AgNPs of larger different shape was formed after more than 3h of growth. The bridging with cysteamine was also found to be effective for denser and homogenous attachment of AgNPs on ITO surface while keeping the dispersion. The experimental optical spectra have been explained using the full Mie theory for scattering and absorption by a homogeneous Ag sphere with modified dielectric constants taking into consideration the electron mean free path limitation.
Zinc oxide [Formula: see text], undoped and Al-doped thin films have been synthesized by the ultrasonic spray-assisted chemical vapor deposition (USCVD) system. The films were deposited on glass substrates. The precursor solution was prepared dissolving zinc chloride in distilled water. First, the precursor concentrations were investigated and optimized before studying [Formula: see text] doped, after we have studied the [Formula: see text]-doped influence on [Formula: see text] films especially optical and electrical properties for use as a transparent conductive oxide (TCO) in solar cell electrodes. The characterizations have been carried out using X-ray diffraction technique, UV-vis spectrophotometry, Hall Effect measurement (ECOPIA), atomic force microscopy (AFM, VEECO Dimension [Formula: see text] and scanning electron microscopy (SEM). X-ray diffraction (XRD) results showed that [Formula: see text] and [Formula: see text]-doped [Formula: see text] films were crystallized in the hexagonal wurtzite structure with [Formula: see text] orientation. Optical measurements have shown that all films exhibit, along the visible range, high transmittance and that optical band gap depends strongly to [Formula: see text]-doped concentration. Hall-effect measurement indicates that the highest carrier concentration [Formula: see text] and the lowest resistivity [Formula: see text] are obtained for the [Formula: see text] AZO sample. The SEM shows that the microstructures of [Formula: see text] and [Formula: see text] are homogeneous and the AFM images prove their microcrystallinity with grains orthogonal to the film surface.
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