The correlation between the second break down current of VFTLP Testing and the passing voltage of Field-Induced CDM Testing has been derived. The derivation is based on the power to failure relation and RLC model of CDM test. The derived correlation has been also demonstrated in experiment. I. BACKGROUNDField-Induced Charged Device Model (CDM) has been widely applied for the CDM qualification test in the industry. However, the CDM test is unable to characterize the operational response of ESD protection devices. The need for device characterization is well met by Very Fast Transmission Line Pulse (VFTLP) test instead. In order to interpret the result of VFTLP test in terms of CDM qualification, the correlation between the passing levels of CDM and VFTLP is indispensible. The correlation between qualification test and TLP test has been demonstrated between HBM and TLP [1][2][3][4][5], and between HMM and TLP [6]. However, the difference between CDM and VFTLP tests is significant, which makes the correlation between them more challenging to find than that of HBM and TLP. II. CDM MODELINGAtwood et al. [2] proposed a three capacitor model for CDM tester. This model has been applied in the simulation of CDM test and sees good approximation [7]. The schematic of the model is shown in Figure 1. C_DUT denotes the capacitance between the Device Under Test (DUT) with the field plate of the CDM tester; C_DG denotes the capacitance between DUT and the ground plate; and C_FG denotes the capacitance between the ground plate and the field plate. Switch S1 represents the pogo pin connecting ground plate and DUT; L1 and R2 represent the parasitic inductance and resistance in the discharging path. During the charging phase of CDM test, S1 remains open and the three capacitors namely C_DUT, C_DG, and C_FG are charged up between high voltage V_CDM and Ground. When discharge occurs, the S1 closes forming a low impedance path to Ground and the capacitors are discharged. Fig. 1. Three Capacitor ModelThe RLC circuit is solved as follows:The current in discharging pass isis therefore,· 1 ( ) 2 C_DUT S1 V_CDM R1 100e6 L1 C_FG C_DG R2
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