The bulk atomic structure of cobalt films deposited on GaAs has been unequivocally determined to be the body-centered-cubic metastable phase. A comparison of the conversion-electron x-ray-absorption fine structure of Co films deposited on GaAs(llO) with similar measurements for the stable phases of hep Co, fee Cu, and bec Fe establishes the Co bec phase with a lattice constant of 2.82 ±0.01 A. Furthermore, this first application of the technique to single-crystal epitaxial films shows it to be a most powerful procedure for establishing their crystal structure.
The behavior of chemical and magnetic interfaces is explored using diffuse x-ray resonant magnetic scattering (XRMS) for CoFe thin films with varying interfacial roughnesses. A comparison of the chemical versus magnetic interfaces shows distinct differences in the behavior of these two related interfaces as the chemical roughness is increased. Such changes appear to be correlated with the behavior of the magnetic hysteresis of the interface, measured by tracking the diffuse XRMS intensity as a function of applied magnetic field.
We demonstrate the feasibility of applying the novel soft-X-ray magnetic circular dichroism (SXMCD) technique to investigate the magnetic properties of magnetic surfaces and ultrathin films. Measurements have been carried out on Ni films ot various thickness on a Cu(100) substrate at the Ni L2.3 absorption edges. The SXMCD data exhibit strong temperature and thickness dependence, giving film thickness dependent Curie temperatures and suggesting that a single monolayer of Ni on a Cu(100) substrate may be non-magnetic
Soft x-ray magnetic circular dichroism (SXMCD) is used to determine independently the magnetic behavior of each layer of Fe/Cr/Fe trilayers deposited on GaAs(001). Submonolayer coverages of Cr on Fe(001) films are found to be ferromagnetic and antialigned to the Fe moment. Subsequent Cr deposition shows a monotonically decreasing total moment, consistent with island growth of ferromagnetic Cr sheets antialigned with adjoining Cr layers. For thin Cr interlayers, the second Fe film is antialigned with the first Fe film, but a second Fe film of less than 2-ML thickness shows no SXMCD signal
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