Inelastic alpha scattering measurements have been performed for 'Si at small angles including zero degrees. A total of 66% of the EO energy-weighted sum rule was identified (using a Satchler version 2 form factor) centered at E"=17. 9 MeV having a width of 4.8 MeV and 34% of the E2 energy-weighted sum rule was identified above E = 15.3 MeV centered at 19.0 MeV with a width of 4.4 MeV. The dependence of the extracted EO strength on form factor and optical potential was explored.
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