The growth mechanism that determines the microstructure of obliquely evaporated Co-CoO tapes has been investigated. A preferred orientation relation hcp-Co 001 CoO 111 is found in the neighboring grains when the hcp-Co grains grow on top of the CoO. However, no preferred orientation is observed in the lower to middle part of the magnetic layer when the CoO grains grow on top of the hcp-Co. The structural properties of the Co-CoO tapes can be explained accordingly based on the preferred orientation relation.
Surface configurations for aromatic polyamide (aramid) film were investigated, with the aim of improving the surface design of basefilm for future Metal Evaporated (ME) tapes. Characteristics of ME tapes with various degrees of surface roughness were measured in this study. Through this investigation, the surface configuration contributing to maximum output and durability is identified; this configuration involves both' spike protrusions and fine protrusions. In addition, narrowing size distribution of fine protrusions considered to be effective in reducing the real contact area, which leads to improved durability.
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