Local structural anisotropy of Tb/Fe multilayers (MLs) was investigated by extended X-ray absorption fine structure (EXAFS) spectroscopy. Quantitative analysis of Fe EXAFS signals was performed to estimate the coordination number related to the structural anisotropy. A difference in the Fourier-transformed Fe EXAFS spectra between two incident polarized light directions has indicated that considerable anisotropy of atomic pair ordering exists in the MLs prepared by sputtering. It was further found that the variation of the structural anisotropy well corresponds to the magnitude of the perpendicular magnetic anisotropy, which changes depending on the bilayer periods and the preparation condition.
We have investigated the local structural anisotropy of Tb/Fe multilayers using linear polarized synchrotron radiation. X-ray absorption measurements were performed at Fe K edge (7.1 keV) using normal and glancing angle incident photon. From the Fe extended x-ray absorption fine structure (EXAFS), the local structural anisotropy was found for all multilayers as a slight difference of oscillation amplitude between the two incident directions. From the Fourier transformed EXAFS spectra, it is found that the local structural anisotropy shows the maximum at bilayer period of about 1 nm, where perpendicular magnetic anisotropy also shows the maximum value in various rare-earth/transition metal multilayers.
We present a newly developed facility, comprised of a combinatorial laser molecular beam epitaxy system and an in-situ scanning tunneling microscopy (STM). This facility aims at accelerating the materials research in a highly efficient way, by advanced high-throughput film synthesis techniques and subsequent fast characterization of surface morphology and electronic states. Compared with uniform films deposited by conventional methods, the so-called combinatorial thin films will be beneficial to determining the accurate phase diagrams of different materials due to the improved control of parameters such as chemical substitution and sample thickness resulting from a rotarymask method. A specially designed STM working under low-temperature and ultra-high vacuum conditions is optimized for the characterization of combinatorial thin films, in an XY coarse motion range of 15 mm × 15 mm and with sub-micrometer location precision. The overall configuration as well as some key aspects like sample holder design, scanner head, and sample/tip/target transfer mechanism are described in detail. The performance of the device is demonstrated by synthesizing high-quality superconducting FeSe thin films with gradient thickness, imaging surfaces of highly oriented pyrolytic graphite, Au (111), Bi 2 Sr 2 CaCu 2 O 8+δ (BSCCO) and FeSe. In addition, we have also obtained clean noise spectra of tunneling junctions and the superconducting energy gap of BSCCO.The successful manufacturing of such a facility opens a new window for the next generation of equipment designed for experimental materials research.
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