Veranderringen der Zrisammensetzring sowie der geometrischert iind elektronisclteit S t r u k t u p von Ober-und Grenzflachen beeinflrissen in erheblichein MuJe die ntakroskopisclten Eigenschafien von Festkorpern. Mit Hiwe cler Pltotoelektronenspktroskopie konnenwesentliche Aussagen iiber diese Bereiclte erltulteri werclen .
SummaryPhotoelectron-Spectroscopy (XPS) is a n analytical method to get quantitative and qualitative informations about element distribution and chemical bonding on solid surfaces and in near surface layers. By means of recent piiblications about catalysis research, clectronics/electrotechnics as well as material development and refinement the performance of XPS will be outlined. 0 kristallographischen Eigenschaften 32 Vokirum in cler Prowis (1991) Nr. 1 S. 32-44 0 VCIl Verlagsge~ellscliaft mbH, D-6940 Weinheirn. 1991 0934-9758/91/0102-0032/53.50 + .25/0 -Vakirum in der Praxis (1Wl) Nr.1
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