In recent years, MgZnO alloy becomes one of the most suitable materials for the fabrication of ultraviolet detectors. In this paper, we have fabricated three metal semiconductor metal (MSM) photodetectors on Mg0.42Zn0.58O film grown by radio frequency magnetron sputtering. The interdigital electrodes are 500 um long and 5 um wide with an interelectrode spacing 2, 5 and 10 um, respectively. The structural, electrical and optical properties of epilayers were characterized by various techniques. At 5 V bias, a peak responsivity of 1.09 mA/W was achieved at 283 nm for the device with 2 um interelectrode spacing. The peak responsivity at 283 nm increased with the reduction of the finger pitch for three devices and the ultraviolet-visible rejection ratio (R283 nm/R400 nm) was more than one order of magnitude at 5 V bias.
Requirement change is always a serious problem for developers and Software companies. Especially in putting ERP software into effect or ERP software secondary development, the requirement change has brought great disaster. The requirement process is not in-depth understanding and having no standard management mechanism are the main reasons for requirement changes. For ERP software companies, they must pay more attention to the requirement process and requirement changes.
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