In this investigation, the growth, structure, and electronic properties of Pt films on the polar surfaces of ZnO were examined using high-resolution electron energy-loss spectroscopy (HREELS) and low-energhy, electron diffraction (LEED). The growth mode of vapor-deposited Pt films on ZnO(0001#) and ZnO(0001) at 300 K was found to be nearly layer-by-layer. The surfaces of Pt films produced in this manner exhibited hexagonal symmetry and were stable up to 600 K. At higher temperatures, the Pt agglomerated into particles which remained oriented with respect to the ZnO substrate. HREELS results indicate that there are only weak interactions at the Pt/ZnO(0001#) interface, while charge transfer and Schottky barrier formation occures at the Pt/ZnO (0001) In this investigation, the growth, structure, and electronic properties of Pt films on the polar surfaces of ZnO were examined using high-resolution electron energy-loss spectroscopy (HREELS) and low~energy, electron diffraction (LEED). The growth mode of vapor-deposited Pt films on ZnO(OOOl) and ZnO(OOOl) at 300 K was found to be nearly layer-by-layer. The surfaces ofPt films produced in this manner exhibited hexagonal symmetry and were stable up to 600 K. At higher temperatures, the Pt agglomerated into particles which remained oriented with respect to the ZnO substrate. HREELS results indicate that there are only weak interactions at the PtlZnO(OOOl) interface, while charge transfer and Schottky barrier formation occurs at the PtlZnO(OOOl) interface.

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