The structure of a thin layer of copper sulfide produced by treating cadmium sulfide with a solution of cuprous chloride was investigated by electron diffraction and transmission electron microscopy. Results show that this copper sulfide layer is composed of chalcocite, Cu2S, and is epitaxial to the cadmium sulfide. No diffraction spots from other copper sulfide phases (such as djurleite, etc.) were observed. Accurate determination of chalcocite lattice spacing was made by using in‐situ cadmium sulfide as standard and Moiré fringes measurements.
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