Phase-change memory materials refer to a class of materials that can exist in amorphous and crystalline phases with distinctly different electrical or optical properties, as well as exhibit outstanding crystallization kinetics and optimal phase transition temperatures. This paper focuses on the potential of colloids as phase-change memory materials. We report a novel synthesis for amorphous GeTe nanoparticles based on an amide-promoted approach that enables accurate size control of GeTe nanoparticles between 4 and 9 nm, narrow size distributions down to 9–10%, and synthesis upscaling to reach multigram chemical yields per batch. We then quantify the crystallization phase transition for GeTe nanoparticles, employing high-temperature X-ray diffraction, differential scanning calorimetry, and transmission electron microscopy. We show that GeTe nanoparticles crystallize at higher temperatures than the bulk GeTe material and that crystallization temperature increases with decreasing size. We can explain this size-dependence using the entropy of crystallization model and classical nucleation theory. The size-dependences quantified here highlight possible benefits of nanoparticles for phase-change memory applications.

Phase-change materials (PCMs), which are wellestablished in optical and random-access memories, are increasingly studied for emerging topics such as brain-inspired computing and active photonics. These applications take advantage of the pronounced reflectivity and resistivity changes that accompany the structural transition in PCMs from their amorphous to crystalline state. However, PCMs are typically fabricated as thin films via sputtering, which is costly, requires advanced equipment, and limits the sample and device design. Here, we investigate a simpler and more flexible approach for applications in tunable photonics: the use of sub-10 nm colloidal PCM nanoparticles (NPs). We report the optical properties of amorphous and crystalline germanium telluride (GeTe) NP thin films from the infrared to the ultraviolet spectral range. Using spectroscopic ellipsometry with support from cross-sectional scanning electron microscopy, atomic force microscopy, and absorption spectroscopy, we extract refractive indices n, extinction coefficients k, and band gaps E g and compare these to values known for sputtered GeTe thin films. We find a decrease of n and k and an increase of E g for NP-based GeTe films, yielding insights into size-dependent property changes for nanoscale PCMs. Furthermore, our results reveal the suitability of GeTe NPs for tunable photonics in the near-infrared and visible spectral range. Thus, PCM NPs are an exciting platform that can allow material properties to be tailored depending on the target application. Finally, we studied sample reproducibility and aging of our NP films. We found that the colloidally prepared PCM thin films were stable for at least 2 months stored under nitrogen, further supporting the great promise of these materials in applications.

phase change memory (pcM) is being actively explored for in-memory computing and neuromorphic systems. the ability of a pcM device to store a continuum of resistance values can be exploited to realize arithmetic operations such as matrix-vector multiplications or to realize the synaptic efficacy in neural networks. However, the resistance variations arising from structural relaxation, 1/f noise, and changes in ambient temperature pose a key challenge. the recently proposed projected pcM concept helps to mitigate these resistance variations by decoupling the physical mechanism of resistance storage from the information-retrieval process. even though the device concept has been proven successfully, a comprehensive understanding of the device behavior is still lacking. Here, we develop a device model that captures two key attributes, namely, resistance drift and the state dependence of resistance. the former refers to the temporal evolution of resistance, while the latter refers to the dependence of the device resistance on the phase configuration of the phase change material. The study provides significant insights into the role of interfacial resistance in these devices. The model is experimentally validated on projected pcM devices based on antimony and a metal nitride fabricated in a lateral device geometry and is also used to provide guidelines for material selection and device engineering.

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